Dr. Kentaro Shibahara received the 2005 SSDM Award, together with Professor Emeritus Hiroyuki Matsunami and co-authors, for the realization of step-controlled epitaxy1.
By introducing an off-axis angle to the 6H-SiC(0001) substrate, Dr. Shibahara and his colleagues achieved the first homoepitaxial growth of high-quality 6H-SiC. This work, named step-controlled epitaxy, was the starting point for the practical realization of today’s SiC power devices and is regarded as a major milestone in the field.
The work built on their earlier research on 3C-SiC growth on off-axis Si(100) substrates and the suppression of antiphase domains (APDs)2 .
Committee Chair Taniguchi and Shibahara
certificate
Committee Chair Taniguchi and Shibahara
Award winners (from right): Naotaka Kuroda,Kentaro Shibahara,Woo Sik Yoo,Shigehiro Nishino,and Hiroyuki Matsunami
Step-controlled epitaxy (also called step-controlled epitaxial growth) is a method for growing low-defect, mirror-smooth SiC single-crystal thin films on a substrate. It is a fundamental technology for manufacturing high-performance SiC power devices, which require high breakdown voltage and low loss, and it contributed greatly to the practical realization of SiC power semiconductors. ↩︎
The introduction of the award-winning paper (Extended Abstract) states: “Recently, we found that off orientation of Si(100) substrates was effective to eliminate antiphase domains. […] Chemical vapor deposition (CVD) growth of both 3C and 6H-SiC on 6H-SiC substrates was reported by several authors, but no one mentioned clearly about the effect of the off orientation of the substrate.” Earlier work by the authors cited there includes: K. Shibahara, S. Nishino, and H. Matsunami, “Surface-morphology of cubic SiC(100) grown on Si(100) by chemical vapor deposition,” J. Crystal Growth 78 (1986) 538–544. DOI: 10.1016/0022-0248(86)90158-2 K. Shibahara, S. Nishino, and H. Matsunami, “Antiphase-domain-free growth of cubic SiC on Si(100),” Appl. Phys. Lett. 50 (1987) 1888–1890. DOI: 10.1063/1.97676 K. Shibahara, T. Saito, S. Nishino, and H. Matsunami, “Inversion-type N-channel MOSFET Using Antiphase-domain Free Cubic-SiC Grown on Si(100),” Extended Abstracts of the 18th International Conference on Solid State Devices and Materials (SSDM 1986), Tokyo, pp. 717–718, 1986. ↩︎